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Electronics
Volume 12
Issue 7
10.3390/electronics12071662
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Journal: Electronics, 2023
Volume: 12
Number: 1662

Article: AMFF-YOLOX: Towards an Attention Mechanism and Multiple Feature Fusion Based on YOLOX for Industrial Defect Detection
Authors: by Yu Chen, Yongwei Tang, Huijuan Hao, Jun Zhou, Huimiao Yuan, Yu Zhang and Yuanyuan Zhao
Link: https://www.mdpi.com/2079-9292/12/7/1662

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