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Journal: Electronics, 2023
Volume: 12
Number: 1403

Article: Study of the Within-Batch TID Response Variability on Silicon-Based VDMOS Devices
Authors: by Xiao Li, Jiangwei Cui, Qiwen Zheng, Pengwei Li, Xu Cui, Yudong Li and Qi Guo
Link: https://www.mdpi.com/2079-9292/12/6/1403

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