Ge, Z.; Jiang, J.; Pugh, E.; Marshall, B.; Yan, Y.; Sun, L.
Vision-Based UAV Landing with Guaranteed Reliability in Adverse Environment. Electronics 2023, 12, 967.
https://doi.org/10.3390/electronics12040967
AMA Style
Ge Z, Jiang J, Pugh E, Marshall B, Yan Y, Sun L.
Vision-Based UAV Landing with Guaranteed Reliability in Adverse Environment. Electronics. 2023; 12(4):967.
https://doi.org/10.3390/electronics12040967
Chicago/Turabian Style
Ge, Zijian, Jingjing Jiang, Ewan Pugh, Ben Marshall, Yunda Yan, and Liang Sun.
2023. "Vision-Based UAV Landing with Guaranteed Reliability in Adverse Environment" Electronics 12, no. 4: 967.
https://doi.org/10.3390/electronics12040967
APA Style
Ge, Z., Jiang, J., Pugh, E., Marshall, B., Yan, Y., & Sun, L.
(2023). Vision-Based UAV Landing with Guaranteed Reliability in Adverse Environment. Electronics, 12(4), 967.
https://doi.org/10.3390/electronics12040967