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        Journal: Electronics, 2023
        Volume: 12 
                	Number: 779 
                
        
        Article:
        Device Status Evaluation Method Based on Deep Learning for PHM Scenarios 
        Authors: 
       	by
                    Pengjun Wang, Jiahao Qin, Jiucheng Li, Meng Wu, Shan Zhou and Le Feng        
        Link:
        https://www.mdpi.com/2079-9292/12/3/779
        
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