Order Article Reprints

Guo Y, Deng J, Niu J, Duan C, Long S, Li M, Li L. Observation of Large Threshold Voltage Shift Induced by Pre-applied Voltage to SiO₂ Gate Dielectric in Organic Field-Effect Transistors. Electronics. 2023; 12(3):540. https://doi.org/10.3390/electronics12030540

Guo, Yifu, Junyang Deng, Jiebin Niu, Chunhui Duan, Shibing Long, Mengmeng Li, and Ling Li. 2023. "Observation of Large Threshold Voltage Shift Induced by Pre-applied Voltage to SiO₂ Gate Dielectric in Organic Field-Effect Transistors" Electronics 12, no. 3: 540. https://doi.org/10.3390/electronics12030540

Guo, Y., Deng, J., Niu, J., Duan, C., Long, S., Li, M., & Li, L. (2023). Observation of Large Threshold Voltage Shift Induced by Pre-applied Voltage to SiO₂ Gate Dielectric in Organic Field-Effect Transistors. Electronics, 12(3), 540. https://doi.org/10.3390/electronics12030540