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Journal: Electronics, 2023
Volume: 12
Number: 4978
Article:
Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits
Authors:
by
Ruiqiang Song, Jinjin Shao, Yaqing Chi, Bin Liang, Jianjun Chen and Zhenyu Wu
Link:
https://www.mdpi.com/2079-9292/12/24/4978
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