Bolanowski, M.; Paszkiewicz, A.; Żabiński, T.; Piecuch, G.; Salach, M.; Tomecki, K.
System Architecture for Diagnostics and Supervision of Industrial Equipment and Processes in an IoE Device Environment. Electronics 2023, 12, 4935.
https://doi.org/10.3390/electronics12244935
AMA Style
Bolanowski M, Paszkiewicz A, Żabiński T, Piecuch G, Salach M, Tomecki K.
System Architecture for Diagnostics and Supervision of Industrial Equipment and Processes in an IoE Device Environment. Electronics. 2023; 12(24):4935.
https://doi.org/10.3390/electronics12244935
Chicago/Turabian Style
Bolanowski, Marek, Andrzej Paszkiewicz, Tomasz Żabiński, Grzegorz Piecuch, Mateusz Salach, and Krzysztof Tomecki.
2023. "System Architecture for Diagnostics and Supervision of Industrial Equipment and Processes in an IoE Device Environment" Electronics 12, no. 24: 4935.
https://doi.org/10.3390/electronics12244935
APA Style
Bolanowski, M., Paszkiewicz, A., Żabiński, T., Piecuch, G., Salach, M., & Tomecki, K.
(2023). System Architecture for Diagnostics and Supervision of Industrial Equipment and Processes in an IoE Device Environment. Electronics, 12(24), 4935.
https://doi.org/10.3390/electronics12244935
