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Journal: Electronics, 2023
Volume: 12
Number: 4573

Article: gemV-tool: A Comprehensive Soft Error Reliability Estimation Tool for Design Space Exploration
Authors: by Hwisoo So, Yohan Ko, Jinhyo Jung, Kyoungwoo Lee and Aviral Shrivastava
Link: https://www.mdpi.com/2079-9292/12/22/4573

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