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Journal: Electronics, 2023
Volume: 12
Number: 4307
Article:
Temperature Reliability Investigation for a 400 W Solid-State Power Amplifier under High and Cold Conditions
Authors:
by
Qian Lin, Fei You, Jihua Wu and Yingchun Lv
Link:
https://www.mdpi.com/2079-9292/12/20/4307
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