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Journal: Electronics, 2023
Volume: 12
Number: 3912
Article:
41.6 Gb/s High-Depth Pre-Interleaver for DFE Error Propagation in 65 nm CMOS Technology
Authors:
by
Yongzheng Zhan, Tuo Li, Xiaofeng Zou, Qingsheng Hu, Lianming Li and Lu Zhang
Link:
https://www.mdpi.com/2079-9292/12/18/3912
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