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Cui Y, Wang C, Liu X, Wu Y, Li Z, Li R, He W. Detection of Subsurface Damage Morphology of Lapped Optical Components by Analysis of the Fluorescence Lifetimes of Quantum Dots. Electronics. 2023; 12(18):3868. https://doi.org/10.3390/electronics12183868

Cui, Yana, Chunyang Wang, Xuelian Liu, Yajie Wu, Zhengze Li, Rong Li, and Wen He. 2023. "Detection of Subsurface Damage Morphology of Lapped Optical Components by Analysis of the Fluorescence Lifetimes of Quantum Dots" Electronics 12, no. 18: 3868. https://doi.org/10.3390/electronics12183868

Cui, Y., Wang, C., Liu, X., Wu, Y., Li, Z., Li, R., & He, W. (2023). Detection of Subsurface Damage Morphology of Lapped Optical Components by Analysis of the Fluorescence Lifetimes of Quantum Dots. Electronics, 12(18), 3868. https://doi.org/10.3390/electronics12183868