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Journal: Electronics, 2023
Volume: 12
Number: 3011

Article: Test Structures for the Characterization of the Gate Resistance in 16 nm FinFET RF Transistors
Authors: by Mario Lauritano, Peter Baumgartner and Ahmet Çağri Ulusoy
Link: https://www.mdpi.com/2079-9292/12/14/3011

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