Wen, Z.; Wang, R.; Chen, S.; Wang, Q.; Ding, K.; Liang, B.; Xu, R.
RDVI: A Retrieval–Detection Framework for Verbal Irony Detection. Electronics 2023, 12, 2673.
https://doi.org/10.3390/electronics12122673
AMA Style
Wen Z, Wang R, Chen S, Wang Q, Ding K, Liang B, Xu R.
RDVI: A Retrieval–Detection Framework for Verbal Irony Detection. Electronics. 2023; 12(12):2673.
https://doi.org/10.3390/electronics12122673
Chicago/Turabian Style
Wen, Zhiyuan, Rui Wang, Shiwei Chen, Qianlong Wang, Keyang Ding, Bin Liang, and Ruifeng Xu.
2023. "RDVI: A Retrieval–Detection Framework for Verbal Irony Detection" Electronics 12, no. 12: 2673.
https://doi.org/10.3390/electronics12122673
APA Style
Wen, Z., Wang, R., Chen, S., Wang, Q., Ding, K., Liang, B., & Xu, R.
(2023). RDVI: A Retrieval–Detection Framework for Verbal Irony Detection. Electronics, 12(12), 2673.
https://doi.org/10.3390/electronics12122673