Feng, H.; Liang, X.; Pu, X.; Xiang, Y.; Zhang, T.; Wei, Y.; Feng, J.; Sun, J.; Zhang, D.; Li, Y.;
et al. Total Ionizing Dose Effects of 60Co γ-Ray Radiation on Split-Gate SiC MOSFETs. Electronics 2023, 12, 2398.
https://doi.org/10.3390/electronics12112398
AMA Style
Feng H, Liang X, Pu X, Xiang Y, Zhang T, Wei Y, Feng J, Sun J, Zhang D, Li Y,
et al. Total Ionizing Dose Effects of 60Co γ-Ray Radiation on Split-Gate SiC MOSFETs. Electronics. 2023; 12(11):2398.
https://doi.org/10.3390/electronics12112398
Chicago/Turabian Style
Feng, Haonan, Xiaowen Liang, Xiaojuan Pu, Yutang Xiang, Teng Zhang, Ying Wei, Jie Feng, Jing Sun, Dan Zhang, Yudong Li,
and et al. 2023. "Total Ionizing Dose Effects of 60Co γ-Ray Radiation on Split-Gate SiC MOSFETs" Electronics 12, no. 11: 2398.
https://doi.org/10.3390/electronics12112398
APA Style
Feng, H., Liang, X., Pu, X., Xiang, Y., Zhang, T., Wei, Y., Feng, J., Sun, J., Zhang, D., Li, Y., Yu, X., & Guo, Q.
(2023). Total Ionizing Dose Effects of 60Co γ-Ray Radiation on Split-Gate SiC MOSFETs. Electronics, 12(11), 2398.
https://doi.org/10.3390/electronics12112398