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Journal: Electronics, 2022
Volume: 11
Number: 1420
Article:
Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction
Authors:
by
Jian Fu Zhang, Rui Gao, Meng Duan, Zhigang Ji, Weidong Zhang and John Marsland
Link:
https://www.mdpi.com/2079-9292/11/9/1420
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