Article Menu
-
Academic Editors
Katarzyna Antosz
Jose Machado
Yi Ren
Rochdi El Abdi
Dariusz Mazurkiewicz
Marina Ranga
Pierluigi Rea
Vijaya Kumar Manupati
Emilia Villani
Show more...
Erika Ottaviano
- Subscribe SciFeed
- Recommended Articles
- Related Info Link
- More by Authors Links
Need Help?
Order Article Reprints
Journal: Electronics, 2022
Volume: 11
Number: 583
583
Article:
Simplistic, Efficient, and Low-Cost Crack Detection of Dielectric Materials Based on Millimeter-Wave Interference
Authors:
by
Liangping Chen, Liangjie Bi, Yong Yin, Yu Qin, Minsheng Song, Bin Wang, Hailong Li and Lin Meng
Link:
https://www.mdpi.com/2079-9292/11/4/583
MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover
and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article
and designed to be complimentary to the journal.
Cite
Chen, L.; Bi, L.; Yin, Y.; Qin, Y.; Song, M.; Wang, B.; Li, H.; Meng, L. Simplistic, Efficient, and Low-Cost Crack Detection of Dielectric Materials Based on Millimeter-Wave Interference. Electronics 2022, 11, 583. https://doi.org/10.3390/electronics11040583
Chen L, Bi L, Yin Y, Qin Y, Song M, Wang B, Li H, Meng L. Simplistic, Efficient, and Low-Cost Crack Detection of Dielectric Materials Based on Millimeter-Wave Interference. Electronics. 2022; 11(4):583. https://doi.org/10.3390/electronics11040583
Chicago/Turabian StyleChen, Liangping, Liangjie Bi, Yong Yin, Yu Qin, Minsheng Song, Bin Wang, Hailong Li, and Lin Meng. 2022. "Simplistic, Efficient, and Low-Cost Crack Detection of Dielectric Materials Based on Millimeter-Wave Interference" Electronics 11, no. 4: 583. https://doi.org/10.3390/electronics11040583
APA StyleChen, L., Bi, L., Yin, Y., Qin, Y., Song, M., Wang, B., Li, H., & Meng, L. (2022). Simplistic, Efficient, and Low-Cost Crack Detection of Dielectric Materials Based on Millimeter-Wave Interference. Electronics, 11(4), 583. https://doi.org/10.3390/electronics11040583
