Zhang, Q.; Liu, L.; Yuan, Y.; Zhang, Z.; He, J.; Gao, Y.; Li, Y.; Guo, X.; Zhao, Y.
A Gate-Level Information Leakage Detection Framework of Sequential Circuit Using Z3. Electronics 2022, 11, 4216.
https://doi.org/10.3390/electronics11244216
AMA Style
Zhang Q, Liu L, Yuan Y, Zhang Z, He J, Gao Y, Li Y, Guo X, Zhao Y.
A Gate-Level Information Leakage Detection Framework of Sequential Circuit Using Z3. Electronics. 2022; 11(24):4216.
https://doi.org/10.3390/electronics11244216
Chicago/Turabian Style
Zhang, Qizhi, Liang Liu, Yidong Yuan, Zhe Zhang, Jiaji He, Ya Gao, Yao Li, Xiaolong Guo, and Yiqiang Zhao.
2022. "A Gate-Level Information Leakage Detection Framework of Sequential Circuit Using Z3" Electronics 11, no. 24: 4216.
https://doi.org/10.3390/electronics11244216
APA Style
Zhang, Q., Liu, L., Yuan, Y., Zhang, Z., He, J., Gao, Y., Li, Y., Guo, X., & Zhao, Y.
(2022). A Gate-Level Information Leakage Detection Framework of Sequential Circuit Using Z3. Electronics, 11(24), 4216.
https://doi.org/10.3390/electronics11244216