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Journal: Electronics, 2022
Volume: 11
Number: 3844

Article: Soft Error Sensitivity Analysis Based on 40 nm SRAM-Based FPGA
Authors: by Xu Xiong, Xuecheng Du, Bo Zheng, Zhi Chen, Wei Jiang, Sanjun He and Yixin Zhu
Link: https://www.mdpi.com/2079-9292/11/23/3844

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