Xiong, X.; Du, X.; Zheng, B.; Chen, Z.; Jiang, W.; He, S.; Zhu, Y.
Soft Error Sensitivity Analysis Based on 40 nm SRAM-Based FPGA. Electronics 2022, 11, 3844.
https://doi.org/10.3390/electronics11233844
AMA Style
Xiong X, Du X, Zheng B, Chen Z, Jiang W, He S, Zhu Y.
Soft Error Sensitivity Analysis Based on 40 nm SRAM-Based FPGA. Electronics. 2022; 11(23):3844.
https://doi.org/10.3390/electronics11233844
Chicago/Turabian Style
Xiong, Xu, Xuecheng Du, Bo Zheng, Zhi Chen, Wei Jiang, Sanjun He, and Yixin Zhu.
2022. "Soft Error Sensitivity Analysis Based on 40 nm SRAM-Based FPGA" Electronics 11, no. 23: 3844.
https://doi.org/10.3390/electronics11233844
APA Style
Xiong, X., Du, X., Zheng, B., Chen, Z., Jiang, W., He, S., & Zhu, Y.
(2022). Soft Error Sensitivity Analysis Based on 40 nm SRAM-Based FPGA. Electronics, 11(23), 3844.
https://doi.org/10.3390/electronics11233844