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Journal: Electronics, 2022
Volume: 11
Number: 3830

Article: Evaluation Index for IVIS Integration Test under a Closed Condition Based on the Analytic Hierarchy Process
Authors: by Jialiang Chen, Huizhe Li, Zhaozheng Hu, Kai Liu and Yue Hou
Link: https://www.mdpi.com/2079-9292/11/22/3830

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