RamÃrez-Aldana, R.; Gomez-Verjan, J.C.; GarcÃa-Peña, C.; Gutiérrez-Robledo, L.M.; Parra-RodrÃguez, L.
Understanding Frailty: Probabilistic Causality between Components and Their Relationship with Death through a Bayesian Network and Evidence Propagation. Electronics 2022, 11, 3001.
https://doi.org/10.3390/electronics11193001
AMA Style
RamÃrez-Aldana R, Gomez-Verjan JC, GarcÃa-Peña C, Gutiérrez-Robledo LM, Parra-RodrÃguez L.
Understanding Frailty: Probabilistic Causality between Components and Their Relationship with Death through a Bayesian Network and Evidence Propagation. Electronics. 2022; 11(19):3001.
https://doi.org/10.3390/electronics11193001
Chicago/Turabian Style
RamÃrez-Aldana, Ricardo, Juan Carlos Gomez-Verjan, Carmen GarcÃa-Peña, Luis Miguel Gutiérrez-Robledo, and Lorena Parra-RodrÃguez.
2022. "Understanding Frailty: Probabilistic Causality between Components and Their Relationship with Death through a Bayesian Network and Evidence Propagation" Electronics 11, no. 19: 3001.
https://doi.org/10.3390/electronics11193001
APA Style
RamÃrez-Aldana, R., Gomez-Verjan, J. C., GarcÃa-Peña, C., Gutiérrez-Robledo, L. M., & Parra-RodrÃguez, L.
(2022). Understanding Frailty: Probabilistic Causality between Components and Their Relationship with Death through a Bayesian Network and Evidence Propagation. Electronics, 11(19), 3001.
https://doi.org/10.3390/electronics11193001
