Order Article Reprints

Jiang J, Wang S, Liu X, Liu J, Li J, Zhou D, Zhang G, Ye H, Tan C. Electron-Irradiation-Induced Degradation of Transfer Characteristics in Super-Junction VDMOSFET. Electronics. 2022; 11(13):2076. https://doi.org/10.3390/electronics11132076

Jiang, Jing, Shaogang Wang, Xu Liu, Jianhui Liu, Jun Li, Dexiang Zhou, Guoqi Zhang, Huaiyu Ye, and Chunjian Tan. 2022. "Electron-Irradiation-Induced Degradation of Transfer Characteristics in Super-Junction VDMOSFET" Electronics 11, no. 13: 2076. https://doi.org/10.3390/electronics11132076

Jiang, J., Wang, S., Liu, X., Liu, J., Li, J., Zhou, D., Zhang, G., Ye, H., & Tan, C. (2022). Electron-Irradiation-Induced Degradation of Transfer Characteristics in Super-Junction VDMOSFET. Electronics, 11(13), 2076. https://doi.org/10.3390/electronics11132076