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Journal: Electronics, 2022
Volume: 11
Number: 1757

Article: Comparison of Total Ionizing Dose Effects in 22-nm and 28-nm FD SOI Technologies
Authors: by Zongru Li, Christopher Jarrett Elash, Chen Jin, Li Chen, Jiesi Xing, Zhiwu Yang and Shuting Shi
Link: https://www.mdpi.com/2079-9292/11/11/1757

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