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The Analysis of SEU in Nanowire FETs and Nanosheet FETs
 
 

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Journal: Electronics, 2021
Volume: 10
Number: 956

Article: TID Circuit Simulation in Nanowire FETs and Nanosheet FETs
Authors: by Jongwon Lee and Myounggon Kang
Link: https://www.mdpi.com/2079-9292/10/8/956

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