Order Article Reprints

Li Y, Zeng C, Li X, Gao L, Yan W, Li D, Zhang Y, Han Z, Luo J. Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions. Electronics. 2021; 10(7):858. https://doi.org/10.3390/electronics10070858

Li, Yangyang, Chuanbin Zeng, Xiaojing Li, Linchun Gao, Weiwei Yan, Duoli Li, Yi Zhang, Zhengsheng Han, and Jiajun Luo. 2021. "Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions" Electronics 10, no. 7: 858. https://doi.org/10.3390/electronics10070858

Li, Y., Zeng, C., Li, X., Gao, L., Yan, W., Li, D., Zhang, Y., Han, Z., & Luo, J. (2021). Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions. Electronics, 10(7), 858. https://doi.org/10.3390/electronics10070858