Li, Y.; Zeng, C.; Li, X.; Gao, L.; Yan, W.; Li, D.; Zhang, Y.; Han, Z.; Luo, J.
Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions. Electronics 2021, 10, 858.
https://doi.org/10.3390/electronics10070858
AMA Style
Li Y, Zeng C, Li X, Gao L, Yan W, Li D, Zhang Y, Han Z, Luo J.
Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions. Electronics. 2021; 10(7):858.
https://doi.org/10.3390/electronics10070858
Chicago/Turabian Style
Li, Yangyang, Chuanbin Zeng, Xiaojing Li, Linchun Gao, Weiwei Yan, Duoli Li, Yi Zhang, Zhengsheng Han, and Jiajun Luo.
2021. "Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions" Electronics 10, no. 7: 858.
https://doi.org/10.3390/electronics10070858
APA Style
Li, Y., Zeng, C., Li, X., Gao, L., Yan, W., Li, D., Zhang, Y., Han, Z., & Luo, J.
(2021). Applications of Direct-Current Current–Voltage Method to Total Ionizing Dose Radiation Characterization in SOI NMOSFETs with Different Process Conditions. Electronics, 10(7), 858.
https://doi.org/10.3390/electronics10070858