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Buffolo M, De Santi C, Norman J, Shang C, Bowers JE, Meneghesso G, Zanoni E, Meneghini M. A Review of the Reliability of Integrated IR Laser Diodes for Silicon Photonics. Electronics. 2021; 10(22):2734. https://doi.org/10.3390/electronics10222734

Buffolo, Matteo, Carlo De Santi, Justin Norman, Chen Shang, John Edward Bowers, Gaudenzio Meneghesso, Enrico Zanoni, and Matteo Meneghini. 2021. "A Review of the Reliability of Integrated IR Laser Diodes for Silicon Photonics" Electronics 10, no. 22: 2734. https://doi.org/10.3390/electronics10222734

Buffolo, M., De Santi, C., Norman, J., Shang, C., Bowers, J. E., Meneghesso, G., Zanoni, E., & Meneghini, M. (2021). A Review of the Reliability of Integrated IR Laser Diodes for Silicon Photonics. Electronics, 10(22), 2734. https://doi.org/10.3390/electronics10222734