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Journal: Electronics, 2021
Volume: 10
Number: 2734

Article: A Review of the Reliability of Integrated IR Laser Diodes for Silicon Photonics
Authors: by Matteo Buffolo, Carlo De Santi, Justin Norman, Chen Shang, John Edward Bowers, Gaudenzio Meneghesso, Enrico Zanoni and Matteo Meneghini
Link: https://www.mdpi.com/2079-9292/10/22/2734

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