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Journal: Electronics, 2021
Volume: 10
Number: 137
Article:
Trapping Dynamics in GaN HEMTs for Millimeter-Wave Applications: Measurement-Based Characterization and Technology Comparison
Authors:
by
Alberto Maria Angelotti, Gian Piero Gibiino, Corrado Florian and Alberto Santarelli
Link:
https://www.mdpi.com/2079-9292/10/2/137
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