1. Introduction
Safety rules for equipment operated by human beings, along with severe reliability requirements for electronics in harsh environments, call for galvanic isolation in several application fields, even at very low power levels, as summarized in
Figure 1a [
1]. A typical galvanically isolated system is shown in
Figure 1b [
1]. It consists of two isolated domains (i.e., with different isolated ground references) that exchange data signals across the galvanic barrier. However, full isolation is provided only if the power supply of Domain 2,
VDD2, is provided from the power supply of Domain 1,
VDD1, by means of a galvanically isolated DC-DC converter. Usually, power levels from a few tens of mW to about 1 W can be transferred across the galvanic barrier by means of magnetic coupling. To this aim, micro-transformer devices are currently used, which exploit a dielectric layer between two stacked spiral windings to withstand an isolation voltage of several kilovolts [
2,
3]. Typically, by using one galvanic barrier (i.e., one transformer), the basic isolation level can be achieved (i.e., about 5–6 kV). Reinforced isolation, which is the highest level of isolation, requires the use of two galvanic barriers connected in series (i.e., double isolation) in order to comply with the 10-kV surge test of the VDE 0884-11 standard [
4]. Double isolation for a power transfer has been demonstrated by using an LC hybrid approach (i.e., an isolation capacitor and an isolation transformer in a resonant mode operation), which boosts efficiency with respect to a traditional two-series-connected scheme [
5]. However, less costly solutions for reinforced isolation rely on one galvanic barrier by means of an isolation transformer with increased thickness for the dielectric layer [
6,
7].
This paper reviews commonly used transformer-based technologies for galvanically isolated DC-DC conversion, which are based on fully integrated thick-oxide transformers [
8,
9] and post-processed stand-alone polyamide transformers [
7,
10,
11], respectively. To this aim, isolation technologies are compared by means of previously available results and new experimental data of a DC-DC converter specifically designed and implemented. The comparison is carried out at a similar isolation rating (i.e., 5 kV) in terms of electrical performance (i.e., isolated output power and efficiency), integration level, design flexibility and fabrication costs in order to highlight the pros and cons of the two approaches.
The paper is organized as follows.
Section 2 describes the system architecture and main circuit topologies for galvanically isolated DC-DC converters, while the characteristics of the two isolation technologies under comparison are detailed in
Section 3.
Section 4 presents the design and experimental performance of a 5-kV 200-mW DC-DC converter for gate drivers, along with a wide comparison between the integration technologies for power transfer applications.
2. Galvanically Isolated DC-DC Conversion: System and Circuit Description
A galvanically isolated DC-DC converter requires a transformer-based power link to exploit the magnetic coupling between two isolated windings, according to the general scheme in
Figure 2. When isolated power regulation is required, a further isolated data link (not represented in
Figure 2) must be included for the feedback control, which typically uses a pulse-width modulation (PMW) approach [
9]. In common implementations (see
Figure 2), the DC-AC conversion is performed by a radio frequency (RF) power oscillator, while a diode rectifier is used for the AC-DC conversion of the isolated voltage at the secondary winding. The isolation transformer can be also used for the voltage step-up, as required by gate driver applications, typically operated at about 20 V.
The crucial performance of an isolated power link is its power efficiency,
η. Indeed, it limits the maximum reliable output power due to thermal dissipation issues. The overall efficiency of the isolated power link is mainly determined by the product of the efficiencies of the three main building blocks (i.e.,
ηOSC,
ηTRASF and
ηRECT). Therefore, it is mandatory to maximize each contribution to obtain a significant DC-DC performance. As far as the power oscillator is concerned, transformer-loaded implementations are straightforward, as the primary winding can be easily used for the LC tank. On the other hand, transistor availability in the adopted integration technology drives the choice of the circuit topology. The main oscillator topologies for the DC-AC conversion are shown in
Figure 3. The most efficient solution is the
D-class oscillator with cross-coupled transistors working as power switches (
Figure 3a), which boosts the drain voltages above the supply voltage,
VDD [
12,
13]. Unfortunately, this solution requires the cross-coupled pair to be implemented with special transistors with very high breakdown for drain voltage, such as the laterally diffused transistors (LDMOS) that are usually integrated into the bipolar-CMOS-DMOS (BCD) technologies [
14,
15]. In this topology, capacitors
CB are used to perform a voltage partition with the gate capacitance of
M1,2, thus properly setting the
VGS peak to prevent gate-oxide breakdown. If only standard MOS devices are available, as in a CMOS process, the traditional complementary cross-coupled oscillator shown in
Figure 3b is an option. It maximizes the oscillation amplitude within the supply voltage, thus avoiding the risk of transistor breakdown while giving the advantage of nearly doubled transconductance at the same current level compared with a simple cross-coupled oscillator. Circuit topologies in
Figure 3c,d are enhanced versions of the traditional complementary cross-coupled oscillator [
16]. They take advantage of current-reuse (CR) and power, combining techniques to improve both output power and efficiency. On the other hand, they require three-winding isolation transformers with a more complex configuration compared to the other circuit topologies. Proper operation of such oscillators requires frequency synchronization at the primary windings, which can be obtained either with a pure inductive (
Figure 3c) [
17] or hybrid coupling (i.e., inductive and capacitive as in
Figure 3d) between the p-MOS and n-MOS cross-coupled pairs [
18].
Typical isolation transformer configurations for an isolated power link are reported in
Figure 4. A traditional stacked transformer with a high turn ratio for voltage step-up is shown in
Figure 4a, which is well suited for gate-driver applications. A three-winding transformer can be implemented by means of an interleaved configuration (
Figure 4b) for both CR oscillator topologies, while a tapped winding arrangement (
Figure 4c) is only compatible with the hybrid coupling one. Due to the three-winding transformer structure, a small voltage step-up can be performed, and therefore, both current-reuse oscillator topologies are suitable for low-/medium-voltage applications. Transformer efficiency,
ηTRASF, is the very bottleneck of the overall system. It is related to both series and parallel losses taking place in the metal windings and substrate, respectively [
19]. Therefore, it is of utmost importance to use thick conductive layers (i.e., copper or gold), as well as fabricating the transformer on a low-conductivity substrate (<10
4 S/m). A crucial role is also played by the magnetic coupling coefficient,
k, between the primary and secondary windings. It is inversely related to the isolation layer thickness and then to the maximum isolation rating of the transformer. The AC-DC conversion is performed by means of a full-wave rectifier. A traditional bridge configuration is preferred for high-voltage applications (i.e.,
VOUT > 8–10 V) [
13,
17,
18,
20], where the diode threshold losses can be tolerated. Alternatively, a simple full-wave rectifier is preferred at the cost of including a center tap connection also for the secondary winding of the isolated transformer [
7]. Schottky diodes are mandatory to achieve a rectifier efficiency above 80% while enabling operation in the VHF band. If the adopted technology does not include Schottky diodes, the rectifier can be also implemented by using diode-connected transistors, especially at lower output voltages, also including a threshold compensation scheme [
2,
5,
9].
Figure 5 can be used to drive the topology selection for the three building blocks of a galvanically isolated DC-DC converter.
4. Experimental Comparison
The comparison between the isolation approaches described in
Section 3 is carried out by taking advantage of two different technologies by STMicroelectronics, which are based on fully integrated thick-oxide and standalone polyimide transformers, respectively.
Figure 8 depicts the scanning electron microscope (SEM) cross-section for both isolation technologies. The thick-oxide technology in
Figure 8a is available on 0.35 µm BCD platforms (with an SOI option for power transfer applications). The transformer can be integrated on Chip A along with the oscillator active core (see
Figure 7a). An isolation rating of 5 kV is guaranteed by the oxide layer between a Cu-thick metal (Metal 4) and an Al-thin metal (Metal 3) (i.e., 3.7 and 0.9 µm, respectively) [
8,
13]. A 6-kV isolation level is achieved by using the oxide layer between Metals 3 and 2 [
9]. Several experimental results are already available on this isolation technology, which can be used for the proposed comparison. The polyimide technology in
Figure 8b is used to fabricate a stand-alone isolation transformer (i.e., Chip T in
Figure 7b). A full Au metal back-end is preferred to minimize the winding series resistances. Specifically, two upper 5-µm thick metals are used for the primary and secondary windings, while a 3-µm metal (Metal 1) is exploited for the underpasses. High resistivity substrate is adopted to minimize losses due to both magnetically induced and vertical displacement currents without using any shielding structure requiring additional masks and higher manufacturing costs [
21]. The polyimide transformer technology withstands basic to reinforced isolation voltages (i.e., 5 to 10 kV), thanks to a variable insulator thickness (from 20 to more than 30 µm) that is obtained by several deposition steps. The main parameters for the polyimide isolation technology are summarized in
Table 1.
By exploiting the stand-alone polyimide transformer approach, a galvanically isolated DC-DC converter for gate driver applications was specifically designed and characterized for an extensive comparison with the fully integrated thick-oxide technology. For a fair comparison, the basic isolation option was chosen. A three-chip architecture (as depicted in
Figure 7b) was used to convert the 5-V voltage supply,
VDD, to a 20-V output voltage,
VOUT, for a maximum isolated output power,
POUT, of about 200 mW. An operative frequency of about 250 MHz was chosen for the DC-DC conversion as a tradeoff among the efficiency performance of its three building blocks. Chip A was designed in a 0.18-μm BCD technology by STMicroelectronics, which provides high-voltage LDMOS transistors suited for a
D-class power oscillator (see
Figure 3a). It is worth mentioning that the adopted LDMOS devices have similar performance to those previously used for fully integrated thick-oxide DC-DC converters [
9,
13]. On the other hand, Chip B was fabricated in the same 0.13-μm CMOS process by STMicroelectronics used in [
13,
17,
18]. Indeed, such technology provides a high-frequency Schottky diode with an elementary active area of 100 μm
2 and a breakdown voltage of 25 V. The rectifier efficiency,
ηRECT, depends on the number of elementary diode cells in parallel,
M. It was set equal to 2 to maximize performance at
VOUT and
POUT of about 20 V and 200 mW, respectively. A full-bridge topology was preferred, as the voltage drops across two series-connected diodes are negligible. As far as the isolation transformer is concerned, a fully stacked two-winding topology was adopted to maximize the magnetic coupling coefficient,
k. The coil geometry was optimized by means of EM simulations in ADS Momentum. A high turn ratio was chosen to obtain the required step-up voltage. The overall geometrical parameters of primary and secondary windings are reported in
Table 2. The microphotograph of the fabricated polyimide isolation transformer (i.e., Chip T in
Figure 7b) is shown in
Figure 9. The dashed box highlights the 20-µm polyimide layer that is required to guarantee basic galvanic isolation. The transformer secondary primary winding outputs are connected to the rectifier input (
VR1 and
VR2) and to the oscillator open drains (
VD1 and
VD2), respectively, with the center tap available for the voltage supply connection (i.e.,
VDD).
Figure 10 shows the simulated performance of the isolation transformer in terms of inductance and
Q-factor of primary and secondary windings as a function of frequency.
Table 3 summarizes the electrical performance of the isolation transformer at the operative frequency of 250 MHz.
The DC-DC converter was assembled chip on board for electrical characterization. A photo of the assembled chips, along with the corresponding sizes, is shown in
Figure 11a, while the testing printed circuit board (PCB) is depicted in
Figure 11b. The DC-DC converter was characterized at increasing dc output voltage,
VOUT, from 15 to 20 V by means of a semiconductor parameter analyzer. All measurements were performed at a 5-V power supply,
VDD, and room temperature.
Figure 12 shows the isolated output power,
POUT, and the power efficiency,
η, as a function of the isolated output voltage,
VOUT. The DC-DC converter achieves its best performance at a
VOUT of about 18.5 V, delivering an isolated output power of 215 mW with 25% efficiency. At a 20-V output voltage, the measured
POUT and
η are 200 mW and 24.5%, respectively.
The experimental performance is summarized and compared with state-of-the-art galvanically isolated DC-DC converters adopting different basic isolation technologies in
Table 4. The comparison only includes isolated converters for high-/medium-voltage applications (i.e., with a voltage gain from 1.6 to 4), which require the most complex isolation transformers in terms of turn ratio compared to DC-DC converters with almost unitary voltage gain [
3,
11]. Moreover, traditional isolation technologies are considered, i.e., without the adoption of magnetic materials, which considerably boost both output power and efficiency performance at the expense of a more complex and expensive process [
22].
From the comparison in
Table 4, several considerations arise. Better performance results are achieved with
D-class power oscillators, enabled by high-BV devices (such as LDMOS of HV MOS), especially when
VOUT is higher than 10 V. On the other hand, the widespread adopted topology for the rectifier is the Schottky diode full bridge, as it allows efficient operation in the VHF band. Finally, two-chip implementations achieve higher power densities than the three-chip one at the expense of higher costs due to larger expensive silicon chips. It is worth noting that, despite significant differences in the isolation technologies, similar power efficiency results are achieved. For deeper analysis, the proposed DC-DC converter is compared with the DC-DC converters in [
13,
18], which shares both similar circuit topologies and technologies for the active circuitries. Specifically,
Table 5 reports the simulated power efficiency breakdown among the DC-DC converter building blocks, also including efficiencies of the bonding wires from the oscillator to the transformer,
ηB1, and from the transformer to the rectifier,
ηB2. It is quite evident that the advantage of a customized isolation transformer (i.e., 60% efficiency) is frustrated by the need for additional bonding wires between Chips A and T. This is only partially due to additional bonding wire losses while being mainly related to the degradation of power oscillator efficiency,
ηOSC, which is 17 percentage points lower than in [
13]. Indeed, only a fully integrated approach for the isolation transformer guarantees an effective codesign between the oscillator active core and the transformer itself, which benefits from a very accurate prediction of on-chip interconnection parasitics for the actual optimization of DC-AC power efficiency.