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Contamination Particle Behavior of Aerosol Deposited Y2O3 and YF3 Coatings under NF3 Plasma

1
Materials and Energy Measurement Center, Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Korea
2
Department of Chemical Engineering, Hanyang University, Seoul 04763, Korea
*
Authors to whom correspondence should be addressed.
These authors contributed equally to this study.
Coatings 2019, 9(5), 310; https://doi.org/10.3390/coatings9050310
Received: 12 April 2019 / Revised: 1 May 2019 / Accepted: 5 May 2019 / Published: 9 May 2019
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Abstract

The internal coatings of chambers exposed to plasma over a long period of time are subject to chemical and physical damage. Contamination particles that are produced by plasma damage to coatings are a major contribution to poor process reliability. In this study, we investigated the behavior of contamination particles produced from plasma damage to Y2O3 and YF3 protective coatings, which were applied by an aerosol deposition method. The coating materials were located at the powered electrode, the grounded electrode, and the grounded wall, which were exposed to a NF3 plasma. The mass loss at the powered electrode, which was exposed to the NF3 plasma etching under an applied bias, showed that the YF3 etching rate was higher than that of Y2O3. Conversely, the mass of coating increased at the grounded electrode and the grounded wall, which were exposed to NF3 plasma etching under zero bias. The mass of the Y2O3 coating increased more than that of the YF3 coating. X-ray photoelectron spectroscopy analysis showed that the Y2O3 coating corroded to YOxFy in the NF3 plasma, and YF3 existed as YFx. Light scattering sensor analysis showed that the YF3 coating produced fewer contamination particles than did the Y2O3 coating. View Full-Text
Keywords: yttrium oxide (Y2O3); yttrium fluoride (YF3); aerosol deposition (AD); contamination particle; plasma etching; NF3 plasma yttrium oxide (Y2O3); yttrium fluoride (YF3); aerosol deposition (AD); contamination particle; plasma etching; NF3 plasma
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This is an open access article distributed under the Creative Commons Attribution License which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited (CC BY 4.0).
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Song, J.-B.; Choi, E.; Oh, S.-G.; Kim, J.-T.; Yun, J.-Y. Contamination Particle Behavior of Aerosol Deposited Y2O3 and YF3 Coatings under NF3 Plasma. Coatings 2019, 9, 310.

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