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Journal: Coatings, 2019
Volume: 9
Number: 685

Article: Electrical and Structural Properties of All-Sputtered Al/SiO2/p-GaN MOS Schottky Diode
Authors: by Tran Anh Tuan Thi, Dong-Hau Kuo, Phuong Thao Cao, Pham Quoc-Phong, Vinh Khanh Nghi and Nguyen Phuong Lan Tran
Link: https://www.mdpi.com/2079-6412/9/10/685

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