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Nowak MP, Stępak B, Pielach M, Stepanenko Y, Wojciechowski T, Bartosewicz B, Chodorow U, Jakubaszek M, Wachulak P, Nyga P. Laser Control of Specular and Diffuse Reflectance of Thin Aluminum Film-Isolator-Metal Structures for Anti-Counterfeiting and Plasmonic Color Applications. Coatings. 2024; 14(10):1298. https://doi.org/10.3390/coatings14101298

Nowak, Michał P., Bogusz Stępak, Mateusz Pielach, Yuriy Stepanenko, Tomasz Wojciechowski, Bartosz Bartosewicz, Urszula Chodorow, Marcin Jakubaszek, Przemysław Wachulak, and Piotr Nyga. 2024. "Laser Control of Specular and Diffuse Reflectance of Thin Aluminum Film-Isolator-Metal Structures for Anti-Counterfeiting and Plasmonic Color Applications" Coatings 14, no. 10: 1298. https://doi.org/10.3390/coatings14101298

Nowak, M. P., Stępak, B., Pielach, M., Stepanenko, Y., Wojciechowski, T., Bartosewicz, B., Chodorow, U., Jakubaszek, M., Wachulak, P., & Nyga, P. (2024). Laser Control of Specular and Diffuse Reflectance of Thin Aluminum Film-Isolator-Metal Structures for Anti-Counterfeiting and Plasmonic Color Applications. Coatings, 14(10), 1298. https://doi.org/10.3390/coatings14101298