Resolving Selected Problems in Surface Topography Analysis by Application of the Autocorrelation Function
Abstract
:1. Introduction
2. Materials and Methods
2.1. Analyzed Surfaces
2.2. Measurement Process
2.3. Proposals of Improvement of Methods for Surface Topography Analysis by Application of the Autocorrelation Function
3. Results
3.1. Reducing Errors in an Areal Form Removal
3.2. Application of an Autocorrelation Function in the Reduction of High-frequency Measurement Errors
3.3. Improving Proposed Methods with a Modeled Data
4. Conclusions
- The autocorrelation function (ACF) can be exceedingly valuable in the validation of the methods for an areal form removal (definition of L-surface). It was presented that using an ACF with analysis of an isometric view of the measured surface topography can improve the applied method and can be crucial in the reduction of errors in ISO 25178 standard amplitude (height) parameter calculation.
- When considering the isometric view of the detail after L-surface removal, the distortion of some features (such as burnished dimples) can be important in both measured data and an areal ACF characterization. The higher distortion of data occurs, the greater differences in the isometric view and ACF were obtained. Reduction of errors in both data can, respectively, similarly reduce the distortion in the ISO 25178 roughness parameters calculations.
- The usage of ACF for details with out-of-feature characteristics can be highly beneficial when the surface contains some deep or wide features, such as dimples. In these cases, omitting the deep features can be necessary for ACF implementation that can affect proposed procedures to be useless. For both analyses, view of surface and ACF graphs, omitting the features is crucial for the definition of S-L-surface.
- Application of ACF for both profile (2D) and an areal (3D) data can be essential in the process of detection (definition) and reduction (removal) of high-frequency measurement errors from the results of surface roughness evaluation. For both types of data analysis, the center part of the ACF can characterize if the measurement errors in the high-frequency domain were reduced entirely. From that matter, filtering method suitability can also be evaluated.
- In some cases, the thresholding of the ACF is required. This technique is significant in the definition of S-surface especially. When applying truncation, some required properties of the S-surface (noise surface) can be defined more adequately. This approach, supporting the ACF characterization, can reduce the distortion of surface topography features, so, respectively, the errors in the calculation of the ISO 25178 surface roughness parameters can also be radically reduced.
- Considering thresholding and out-of-feature methods, they can be applied simultaneously when reducing surface height is crucial in the validation of the filtering technique. The sequence of application of those methods does not affect the analyzed type of surface, but, respectively, the sizes, densities, and distribution of the features located on the studied surface must be thoroughly considered.
- From all of the studies provided, it was presented that the application of the ACF scheme can significantly reduce the errors in the processes of an areal form removal (definition of L-surface) and suppression of high-frequency measurement noise (indicated as the S-surface). It was proved that even regular and commonly used methods can be especially valuable when applied appropriately.
- All of those data processing actions are crucial in the process of control of manufactured parts. Reducing errors in surface roughness measurement and data analysis can radically affect the validation of machined parts. Improper definition of S-L surface, especially L-surface, can cause classification of properly made parts as a lack and its rejection. From that matter, all of the actions made on the reduction of errors in roughness evaluation (definition of S-L surface) can be consequently crucial in industrial applications.
5. The Outlook
- Comprehensive analysis of the ACF for both 3D (areal) and 2D (profile) data must be improved in the edge effect of surface filtering. Many studies provide some general proposals for reducing the effect of edge data on the surface roughness evaluation; nevertheless, the reduction of errors in ISO 25178 parameters calculation with the usage of ACF was not already presented.
- Even though least-square methods, such as least-square fitted cylinder elements or polynomial planes of various degrees, are providing encouraging results, digital filtering, e.g., those based on the Gaussian function, is still often used and the results considered. From that matter, more studies on the Gaussian filtering methods must still be proposed.
- In some cases of analysis with ACF function, the thresholding method is required. Even though a range (0.13%–99.97%) of thresholding techniques was proposed, according to the previously studied cases, those values should be studied considering each type of surface texture. Moreover, the dependences on the surface feature size, density, and location can also be found when the thresholding method is used.
- The influence of surface directionality on the ACF characterization should be studied as well. It was introduced in some previous studies that direction methods can be exceedingly valuable in the process of high-frequency measurement noise reduction, improving its impact in both the detection and removal of noise data.
- The effect of the bi-directionality of surface features was not comprehensively studied in both L-surface and S-surface definitions. When reducing errors in high-frequency measurement noise reduction, the S-surface properties were studied when one or even two directions were defined on the analyzed surface. It must be studied widely, and, respectively, some proposals should be unified.
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
Nomenclature
References
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Podulka, P. Resolving Selected Problems in Surface Topography Analysis by Application of the Autocorrelation Function. Coatings 2023, 13, 74. https://doi.org/10.3390/coatings13010074
Podulka P. Resolving Selected Problems in Surface Topography Analysis by Application of the Autocorrelation Function. Coatings. 2023; 13(1):74. https://doi.org/10.3390/coatings13010074
Chicago/Turabian StylePodulka, Przemysław. 2023. "Resolving Selected Problems in Surface Topography Analysis by Application of the Autocorrelation Function" Coatings 13, no. 1: 74. https://doi.org/10.3390/coatings13010074