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Journal: Nanomaterials, 2019
Volume: 9
Number: 633
633
Article: Nanoscale Characterization of V-Defect in InGaN/GaN QWs LEDs Using Near-Field Scanning Optical Microscopy
Authors: by Yufeng Li, Weihan Tang, Ye Zhang, Maofeng Guo, Qiang Li, Xilin Su, Aixing Li and Feng Yun
Link: https://www.mdpi.com/2079-4991/9/4/633

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