Zhong, X.; Liang, G.; Meng, L.; Xi, W.; Gu, L.; Tian, N.; Zhai, Y.; He, Y.; Huang, Y.; Jin, F.;
et al. Automated Particle Size Analysis of Supported Nanoparticle TEM Images Using a Pre-Trained SAM Model. Nanomaterials 2025, 15, 1886.
https://doi.org/10.3390/nano15241886
AMA Style
Zhong X, Liang G, Meng L, Xi W, Gu L, Tian N, Zhai Y, He Y, Huang Y, Jin F,
et al. Automated Particle Size Analysis of Supported Nanoparticle TEM Images Using a Pre-Trained SAM Model. Nanomaterials. 2025; 15(24):1886.
https://doi.org/10.3390/nano15241886
Chicago/Turabian Style
Zhong, Xiukun, Guohong Liang, Lingbei Meng, Wei Xi, Lin Gu, Nana Tian, Yong Zhai, Yutong He, Yuqiong Huang, Fengmin Jin,
and et al. 2025. "Automated Particle Size Analysis of Supported Nanoparticle TEM Images Using a Pre-Trained SAM Model" Nanomaterials 15, no. 24: 1886.
https://doi.org/10.3390/nano15241886
APA Style
Zhong, X., Liang, G., Meng, L., Xi, W., Gu, L., Tian, N., Zhai, Y., He, Y., Huang, Y., Jin, F., & Gao, H.
(2025). Automated Particle Size Analysis of Supported Nanoparticle TEM Images Using a Pre-Trained SAM Model. Nanomaterials, 15(24), 1886.
https://doi.org/10.3390/nano15241886