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Journal: Nanomaterials, 2025
Volume: 15
Number: 780
Article:
Effects of Deposition Power and Annealing Temperature on Indium Zinc Oxide (IZO) Film’s Properties and Their Applications to the Source–Drain Electrodes of Amorphous Indium Gallium Zinc Oxide (a-IGZO) Thin-Film Transistors (TFTs)
Authors:
by
Yih-Shing Lee, Chih-Hsiang Chang, Bing-Shin Le, Vo-Truong Thao Nguyen, Tsung-Cheng Tien and Horng-Chih Lin
Link:
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