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Journal: Nanomaterials, 2024
Volume: 14
Number: 1984
Article:
The Trapping Mechanism at the AlGaN/GaN Interface and the Turn-On Characteristics of the p-GaN Direct-Coupled FET Logic Inverters
Authors:
by
Junfeng Yu, Jihong Ding, Tao Wang, Yukai Huang, Wenzhang Du, Jiao Liang, Hongping Ma, Qingchun Zhang, Liang Li, Wei Huang and Wei Zhang
Link:
https://www.mdpi.com/2079-4991/14/24/1984
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