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Feltin N, Crouzier L, Delvallée A, Pellegrino F, Maurino V, Bartczak D, Goenaga-Infante H, Taché O, Marguet S, Testard F, et al. Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles. Nanomaterials. 2023; 13(6):993. https://doi.org/10.3390/nano13060993

Feltin, Nicolas, Loïc Crouzier, Alexandra Delvallée, Francesco Pellegrino, Valter Maurino, Dorota Bartczak, Heidi Goenaga-Infante, Olivier Taché, Sylvie Marguet, Fabienne Testard, and et al. 2023. "Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles" Nanomaterials 13, no. 6: 993. https://doi.org/10.3390/nano13060993

Feltin, N., Crouzier, L., Delvallée, A., Pellegrino, F., Maurino, V., Bartczak, D., Goenaga-Infante, H., Taché, O., Marguet, S., Testard, F., Artous, S., Saint-Antonin, F., Salzmann, C., Deumer, J., Gollwitzer, C., Koops, R., Sebaïhi, N., Fontanges, R., Neuwirth, M., ... Hodoroaba, V.-D. (2023). Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles. Nanomaterials, 13(6), 993. https://doi.org/10.3390/nano13060993