Feng, J.; Jeon, S.-H.; Park, J.; Lee, S.-H.; Jang, J.; Kang, I.M.; Kim, D.-K.; Bae, J.-H.
Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment. Nanomaterials 2023, 13, 1722.
https://doi.org/10.3390/nano13111722
AMA Style
Feng J, Jeon S-H, Park J, Lee S-H, Jang J, Kang IM, Kim D-K, Bae J-H.
Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment. Nanomaterials. 2023; 13(11):1722.
https://doi.org/10.3390/nano13111722
Chicago/Turabian Style
Feng, Junhao, Sang-Hwa Jeon, Jaehoon Park, Sin-Hyung Lee, Jaewon Jang, In Man Kang, Do-Kyung Kim, and Jin-Hyuk Bae.
2023. "Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment" Nanomaterials 13, no. 11: 1722.
https://doi.org/10.3390/nano13111722
APA Style
Feng, J., Jeon, S.-H., Park, J., Lee, S.-H., Jang, J., Kang, I. M., Kim, D.-K., & Bae, J.-H.
(2023). Improvement in Switching Characteristics and Bias Stability of Solution-Processed Zinc–Tin Oxide Thin Film Transistors via Simple Low-Pressure Thermal Annealing Treatment. Nanomaterials, 13(11), 1722.
https://doi.org/10.3390/nano13111722
