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Journal: Nanomaterials, 2023
Volume: 13
Number: 198

Article: First Order Rate Law Analysis for Reset State in Vanadium Oxide Thin Film Resistive Random Access Memory Devices
Authors: by Kai-Huang Chen, Chien-Min Cheng, Na-Fu Wang, Hsiao-Wen Hung, Cheng-Ying Li and Sean Wu
Link: https://www.mdpi.com/2079-4991/13/1/198

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