Matouk, Z.; Islam, M.; Gutiérrez, M.; Pireaux, J.-J.; Achour, A.
X-ray Photoelectron Spectroscopy (XPS) Analysis of Ultrafine Au Nanoparticles Supported over Reactively Sputtered TiO2 Films. Nanomaterials 2022, 12, 3692.
https://doi.org/10.3390/nano12203692
AMA Style
Matouk Z, Islam M, Gutiérrez M, Pireaux J-J, Achour A.
X-ray Photoelectron Spectroscopy (XPS) Analysis of Ultrafine Au Nanoparticles Supported over Reactively Sputtered TiO2 Films. Nanomaterials. 2022; 12(20):3692.
https://doi.org/10.3390/nano12203692
Chicago/Turabian Style
Matouk, Zineb, Mohammad Islam, Monserrat Gutiérrez, Jean-Jacques Pireaux, and Amine Achour.
2022. "X-ray Photoelectron Spectroscopy (XPS) Analysis of Ultrafine Au Nanoparticles Supported over Reactively Sputtered TiO2 Films" Nanomaterials 12, no. 20: 3692.
https://doi.org/10.3390/nano12203692
APA Style
Matouk, Z., Islam, M., Gutiérrez, M., Pireaux, J.-J., & Achour, A.
(2022). X-ray Photoelectron Spectroscopy (XPS) Analysis of Ultrafine Au Nanoparticles Supported over Reactively Sputtered TiO2 Films. Nanomaterials, 12(20), 3692.
https://doi.org/10.3390/nano12203692