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Journal: Nanomaterials, 2022
Volume: 12
Number: 3097
3097
Article: Importance of Structural Relaxation on the Electrical Characteristics and Bias Stability of Solution-Processed ZnSnO Thin-Film Transistors
Authors: by Yu-Jin Hwang, Do-Kyung Kim, Sang-Hwa Jeon, Ziyuan Wang, Jaehoon Park, Sin-Hyung Lee, Jaewon Jang, In Man Kang and Jin-Hyuk Bae
Link: https://www.mdpi.com/2079-4991/12/18/3097

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