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Journal: Nanomaterials, 2022
Volume: 12
Number: 71
71
Article: Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors
Authors: by Ivo Konvalina, Aleš Paták, Martin Zouhar, Ilona Müllerová, Tomáš Fořt, Marek Unčovský and Eliška Materna Mikmeková
Link: https://www.mdpi.com/2079-4991/12/1/71

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