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Journal: Nanomaterials, 2020
Volume: 10
Number: 1634

Article: Electromagnetic Analysis of Vertical Resistive Memory with a Sub-nm Thick Electrode
Authors: by Batyrbek Alimkhanuly, Sanghoek Kim, Lok-won Kim and Seunghyun Lee
Link: https://www.mdpi.com/2079-4991/10/9/1634

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