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Journal: Nanomaterials, 2020
Volume: 10
Number: 197
Article:
Defect Structure Determination of GaN Films in GaN/AlN/Si Heterostructures by HR-TEM, XRD, and Slow Positrons Experiments
Authors:
by
Vladimir Lucian Ene, Doru Dinescu, Nikolay Djourelov, Iulia Zai, Bogdan Stefan Vasile, Andreea Bianca Serban, Victor Leca and Ecaterina Andronescu
Link:
https://www.mdpi.com/2079-4991/10/2/197
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