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Journal: Nanomaterials, 2020
Volume: 10
Number: 2225
Article:
In Situ and Real-Time Nanoscale Monitoring of Ultra-Thin Metal Film Growth Using Optical and Electrical Diagnostic Tools
Authors:
by
Jonathan Colin, Andreas Jamnig, Clarisse Furgeaud, Anny Michel, Nikolaos Pliatsikas, Kostas Sarakinos and Gregory Abadias
Link:
https://www.mdpi.com/2079-4991/10/11/2225
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