Kim, Y.; Lee, S.; Kim, S.-E.; Kim, Y.; Ju, X.; Lee, Y.; Zhang, T.; Kim, J.; Choi, S.; Heo, J.Y.;
et al. Enhanced Sensitivity and Altered EEG Patterns During General Anesthesia in BTBR Mice, a Model of Autism. Brain Sci. 2026, 16, 391.
https://doi.org/10.3390/brainsci16040391
AMA Style
Kim Y, Lee S, Kim S-E, Kim Y, Ju X, Lee Y, Zhang T, Kim J, Choi S, Heo JY,
et al. Enhanced Sensitivity and Altered EEG Patterns During General Anesthesia in BTBR Mice, a Model of Autism. Brain Sciences. 2026; 16(4):391.
https://doi.org/10.3390/brainsci16040391
Chicago/Turabian Style
Kim, Yeonsu, Seounghun Lee, Seong-Eun Kim, Yeojung Kim, Xianshu Ju, Yulim Lee, Tao Zhang, Juyeon Kim, Sungho Choi, Jun Young Heo,
and et al. 2026. "Enhanced Sensitivity and Altered EEG Patterns During General Anesthesia in BTBR Mice, a Model of Autism" Brain Sciences 16, no. 4: 391.
https://doi.org/10.3390/brainsci16040391
APA Style
Kim, Y., Lee, S., Kim, S.-E., Kim, Y., Ju, X., Lee, Y., Zhang, T., Kim, J., Choi, S., Heo, J. Y., Chung, W., & Park, J.
(2026). Enhanced Sensitivity and Altered EEG Patterns During General Anesthesia in BTBR Mice, a Model of Autism. Brain Sciences, 16(4), 391.
https://doi.org/10.3390/brainsci16040391
