Ni, K.; Cheng, X.; Huang, B.; Liu, S.; Shao, J.; Wu, Z.; Chen, J.; Huang, M.
Quantitative Evaluation of Subsurface Damage by Improved Total Internal Reflection Microscopy. Appl. Sci. 2019, 9, 1819.
https://doi.org/10.3390/app9091819
AMA Style
Ni K, Cheng X, Huang B, Liu S, Shao J, Wu Z, Chen J, Huang M.
Quantitative Evaluation of Subsurface Damage by Improved Total Internal Reflection Microscopy. Applied Sciences. 2019; 9(9):1819.
https://doi.org/10.3390/app9091819
Chicago/Turabian Style
Ni, Kaizao, Xin Cheng, Baoming Huang, Shijie Liu, Jianda Shao, Zhouling Wu, Jian Chen, and Ming Huang.
2019. "Quantitative Evaluation of Subsurface Damage by Improved Total Internal Reflection Microscopy" Applied Sciences 9, no. 9: 1819.
https://doi.org/10.3390/app9091819
APA Style
Ni, K., Cheng, X., Huang, B., Liu, S., Shao, J., Wu, Z., Chen, J., & Huang, M.
(2019). Quantitative Evaluation of Subsurface Damage by Improved Total Internal Reflection Microscopy. Applied Sciences, 9(9), 1819.
https://doi.org/10.3390/app9091819