Next Article in Journal
FAST-FUSION: An Improved Accuracy Omnidirectional Visual Odometry System with Sensor Fusion and GPU Optimization for Embedded Low Cost Hardware
Next Article in Special Issue
Thermomechanical Performance of Bio-Inspired Corrugated-Core Sandwich Structure for a Thermal Protection System Panel
Previous Article in Journal
Numerical and Statistical Analyses of Tsunami Heights with the L-Moments Method
Previous Article in Special Issue
Failure Prediction for the Tearing of a Pin-Loaded Dual Phase Steel (DP980) Adjusting Guide
 
 

Order Article Reprints

Journal: Appl. Sci., 2019
Volume: 9
Number: 5518

Article: Spatial Monitoring of Wafer Map Defect Data Based on 2D Wavelet Spectrum Analysis
Authors: by Munwon Lim and Suk Joo Bae
Link: https://www.mdpi.com/2076-3417/9/24/5518

MDPI offers high quality article reprints with convenient shipping to destinations worldwide. Each reprint features a 270 gsm bright white cover and 105 gsm premium white paper, bound with two stitches for durability and printed in full color. The cover design is customized to your article and designed to be complimentary to the journal.

Order Cost and Details

Shipping Address

Billing Address

Notes or Comments

Validate and Place Order

The order must be prepaid after it is placed

req denotes required fields.
Back to TopTop