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Journal: Appl. Sci., 2019
Volume: 9
Number: 242

Article: Ultraprecision Diameter Measurement of Small Holes with Large Depth-To-Diameter Ratios Based on Spherical Scattering Electrical-Field Probing
Authors: by Xingyuan Bian, Junning Cui, Yesheng Lu and Jiubin Tan
Link: https://www.mdpi.com/2076-3417/9/2/242

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